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Abstract

Study of 2D and 3D Optical Beam Induced Voltage Imaging Using Photoresistor Sensor. This article shows a method to study OBIV (optical beam induced voltage) imagerie system, that usually employ a laser scanning microscopy system. The OBIV imagerie system developed use a photoresistor sensor as a sample and simultaneously it can be used for analyzing its inhomogeneity response. Resolution of the system is still low, about 350μm due to high value of incident light diameter. The results inform that photoresistor sensors gave an optimum response if the incident light hits the center of sensible zone.

Bahasa Abstract

Artikel ini menunjukkan sebuah metode untuk memahami sistem pencitraan OBIV (optical beam induced voltage) yang biasanya menggunakan sistem laser scanning microscopy. Sistem pencitraan OBIV ini memanfaatkan sensor fotoresistor sebagai sampel uji yang sekaligus dapat digunakan untuk menganalisis homogenitas tanggapannya. Resolusi dari sistem pencitraan ini masih terlalu rendah yaitu sekitar 350μm disebabkan oleh besarnya diameter cahaya jatuh. Hasil pencitraan OBIV menginformasikan bahwa fotoresistor memberikan tanggapan optimal ketika cahaya jatuh pada bagian tengah permukaannya.

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