Construction of a Novel Method of Measuring Thermal Conductivity for Nanostructures

Authors

Hiroya Ikeda, Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8011, JapanFollow
Shoma Yoshida, Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8011, Japan
Yuhei Suzuki, Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8011, Japan
Veerappan Manimuthu, Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8011, Japan
Faiz Salleh, Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8011, Japan
Fujio Kuwahara, Graduate School of Engineering, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8561, Japan
Masaru Shimomura, Graduate School of Engineering, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8561, Japan
Kenji Murakami, Graduate School of Engineering, Shizuoka University, Johoku 3-5-1, Naka-ku, Hamamatsu 432-8561, Japan

Abstract

With the aim of characterizing the thermal conduction in a nanometer-scaled materials, we have constructed a novel method on the basis of an ac calorimetric method. In this method, periodic sample heating is performed by light irradiation and the corresponding periodic temperature is detected by infrared irradiative thermometer. This makes us measure the thermal diffusivity out of contact with the objective sample. In the present study, we confirm to measure the thermal diffusivity of bulk Si and Cu by this non-contact method with halogen-lamp irradiation. In determining the thermal diffusivity from the relationship between distance deviation and delay time, the simplest wave equation is used, and the obtained values of thermal diffusivity for Si and Cu are close to those reported. Therefore, this non-contact method is useful for evaluating the thermal conduction and applicable for nanometer-scaled materials by improving local heating and local detecting systems.

Bahasa Abstract

Penyusunan Metode Baru untuk Mengukur Konduktivitas Termal untuk Strukturnano. Dengan tujuan untuk menggambarkan proses konduksi termal pada bahan-bahan berskala nanometer, kami telah menyusun sebuah metode baru yang didasarkan pada metode kalorimetrik ac. Di dalam metode ini, pemanasan sampel secara periodik dilaksanakan dengan iradiasi sinar, dan suhu periodik yang sejajar dideteksi dengan termometer iradiatif infra merah. Dengan demikian, kami mengukur difusivitas termal tanpa melibatkan kontak dengan sampel objektif. Di dalam kajian ini, kami memutuskan untuk mengukur difusivitas termal dari limbak Si dan Cu menggunakan metode tanpa kontak ini dengan iradiasi lampu halogen. Untuk menentukan difusivitas termal dari hubungan antara deviasi jarak dan waktu tunda, kami menggunakan persamaan gelombang yang paling sederhana, dan angka-angka difusivitas termal dari Si dan Cu yang diperoleh ternyata hampir sama dengan angka-angka yang telah dilaporkan. Oleh karena itu, metode tanpa kontak ini berguna untuk mengevaluasi konduksi termal dan dapat diterapkan untuk bahan-bahan berskala nanometer dengan memperbaiki pemanasan lokal dan sistem-sistem pendeteksian lokal.

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Recommended Citation

Ikeda, Hiroya; Yoshida, Shoma; Suzuki, Yuhei; Manimuthu, Veerappan; Salleh, Faiz; Kuwahara, Fujio; Shimomura, Masaru; and Murakami, Kenji (2015) "Construction of a Novel Method of Measuring Thermal Conductivity for Nanostructures," Makara Journal of Technology: Vol. 19: Iss. 1, Article 3.
DOI: 10.7454/mst.v19i1.3024
Available at: https://scholarhub.ui.ac.id/mjt/vol19/iss1/3